Characterization of Bismuth Titanate by Line Profile Analysis
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Abstract
Bismuth Titanate (BIT), Bi4Ti3O12, was synthesized using the solid-state reaction process from the oxide mixture of Bi2O3CO3 and TiO2. The characterization analysis of the prepared sample was done by X-ray diffraction technique. The X-ray diffraction data revealed an orthorhombic perovskite phase that was clearly explained. The Scherrer method, modified W-H analysis, and the SSP studies were conducted to figure out the crystallite size and micro strain in Bi4Ti3O12. Morphological studies included SEM and TEM analysis. FTIR spectral investigation supports the M-O coordination of the synthesized Bi4Ti3O12 sample. The phase formation patterns of Bi4Ti3O12 determined by different methods are highly connected.