, Nageswara Rao Moparthi, Dr. N. Geethanji. “An Enhanced Bayesian Decision Tree Model for Defect Detection on Complex SDLC Defect Data”. International Journal on Recent and Innovation Trends in Computing and Communication 3, no. 11 (November 30, 2015): 6360–6365. Accessed July 27, 2024. https://ijritcc.org/index.php/ijritcc/article/view/5052.