, Vaishav A. Panchal, Ravi K Patel, Bhavesh A. Patel, Haresh A. Patel. “Effect of Process Parameters on Surface Quality and MRR in EDM of SS 440 C Using ANN”. International Journal on Recent and Innovation Trends in Computing and Communication 2, no. 7 (July 31, 2014): 1949–1957. Accessed July 28, 2024. https://ijritcc.org/index.php/ijritcc/article/view/3437.