ANCHANA JOSEPH, R. J. . Characterization of Bismuth Titanate by Line Profile Analysis. International Journal on Recent and Innovation Trends in Computing and Communication, [S. l.], v. 11, n. 8, p. 527–533, 2023. DOI: 10.17762/ijritcc.v11i8.9567. Disponível em: https://ijritcc.org/index.php/ijritcc/article/view/9567. Acesso em: 17 jul. 2024.