Quality Analysis of Software Applications using Software Reliability Growth Models and Deep Learning Models

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Published: Aug 18, 2023
DOI: https://doi.org/10.17762/ijritcc.v11i8s.7226
Keywords:
Software reliability growth models (SRGM's), Deep Learning (DL), Faults, Errors, Exceptions

Main Article Content

M. Jeevana Sujitha
Research Scholar, Department of Computer Science and Engineering, Koneru Lakshmaiah Education Foundation, Vaddeswaram, AP, India
Kodukula Subrahmanyam
Department of Computer Science and Engineering, Koneru Lakshmaiah Education Foundation, Vaddeswaram, AP, India

Abstract

Finding the faults in the software is a very tedious task. Many software companies are trying to develop high-quality software which is having no faults. It is very important to analyze the errors, faults, and bugs in software development. Software reliability growth models (SRGM's) are used to help the software industries to create quality software products. Quality is the software metric that is used to analyze the performance of the software product. The software product which is having no errors or faults is considered the best software product. SRGM is also utilized to analyze the software quality based on the programming language. Deep Learning (DL) is a sub-domain in machine learning to solve several complex issues in software development. Finding accurate patterns from software faults is a very tedious task. DL algorithm performs better in integrating the SRGM with the DL approaches giving better results based on software fault detection. Many software faults real-time datasets are available to analyze the DL approaches. The performances of the various integrated models are analyzed by showing the quality metrics.

Article Details

How to Cite
Sujitha, M. J. ., & Subrahmanyam, K. . (2023). Quality Analysis of Software Applications using Software Reliability Growth Models and Deep Learning Models. International Journal on Recent and Innovation Trends in Computing and Communication, 11(8s), 454–462. https://doi.org/10.17762/ijritcc.v11i8s.7226
Issue
Vol. 11 No. 8s (2023)
Section
Articles

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